Olympus Whitepaper: Reaching the next level of surface metro

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Particularly, how to capture the shape of any surface and measure challenging samples.

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It is written by Dr. Megan Cordill who researches thin films on polymer substrates for flexible electronic applications. She uses confocal laser scanning microscopy, using LEXT, as an alternative to atomic force microscopy to facilitate the development of robust flexible electronic devices.


“Manufacturers can now determine when cracks form, and respond to this information,” says Dr. Megan Cordill. “Our approach is instrumental in guiding the optimization of materials and fabrication processes, leading us towards robust, market-ready devices.”

Note that this is an Olympus whitepaper and that you do have to provide some details to download the free whitepaper.

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